Published July 2008
| Version v1
Journal article
Making the surface of nanocrystalline Ni on an Si substrate ultrasmooth by direct electrodeposition
- 1. Materials Science Program, University of Vermont, Burlington, VT 05405 (United States)
- 2. School of Engineering, University of Vermont, 33 Colchester Avenue, Burlington, VT 05405 (United States)
- 3. Physics Department, University of Vermont, Burlington, VT 05405 (United States)
- 4. New Jersey Center for Biomaterials, Rutgers University, Piscataway, NJ 08854 (United States)
Description
Nanocrystalline (50-μm-thick) Ni films with controlled surface morphology at the nanoscale were synthesized by direct-current electrodeposition of Ni on an Si substrate under different electrochemical conditions. A relationship between spatial roughness scaling and mean grain size in electrodeposited Ni was established using X-ray diffraction and atomic force microscopy. Fractal analysis showed a transition from self-affine to ultrasmooth surfaces. A non-destructive method is demonstrated to estimate the grain size distribution of ultrasmooth nanocrystalline Ni surfaces by atomic force microscopy with high-resolution probes
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2008.02.039Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2008.02.039;
- PII
- S1359-6462(08)00179-6;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 59
- Journal Issue
- 1
- Journal Page Range
- p. 103-106
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40027604
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTALS; DIRECT CURRENT; ELECTROCHEMISTRY; ELECTROPLATING; FILMS; FRACTALS; GRAIN SIZE; MORPHOLOGY; NANOSTRUCTURES; NICKEL; ROUGHNESS; SILICON; SURFACES; X-RAY DIFFRACTION
- Descriptors DEC
- CHEMISTRY; COHERENT SCATTERING; CURRENTS; DEPOSITION; DIFFRACTION; ELECTRIC CURRENTS; ELECTRODEPOSITION; ELECTROLYSIS; ELEMENTS; LYSIS; METALS; MICROSCOPY; MICROSTRUCTURE; PLATING; SCATTERING; SEMIMETALS; SIZE; SURFACE COATING; SURFACE PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.