Published June 26, 2013
| Version v1
Journal article
Controlled argon beam-induced desulfurization of monolayer molybdenum disulfide
Creators
- 1. Chemistry, Physics, and Materials Science and Engineering, University of California, Riverside, CA 92521 (United States)
- 2. Department of Physics, University of Central Florida, Orlando, FL 32816 (United States)
- 3. Departments of Physics and Electrical Engineering, Columbia University, New York, NY 10027 (United States)
Description
Sputtering of MoS2 films of single-layer thickness by low-energy argon ions selectively reduces the sulfur content of the material without significant depletion of molybdenum. X-ray photoelectron spectroscopy shows little modification of the Mo 3d states during this process, suggesting the absence of significant reorganization or damage to the overall structure of the MoS2 film. Accompanying ab initio molecular dynamics simulations find clusters of sulfur vacancies in the top plane of single-layer MoS2 to be structurally stable. Measurements of the photoluminescence at temperatures between 175 and 300 K show quenching of almost 80% for an ∼10% decrease in sulfur content. (fast track communication)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/25/25/252201Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 25
- Journal Issue
- 25
- Journal Page Range
- [5 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44114536
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ARGON; ARGON IONS; BEAMS; DESULFURIZATION; FILMS; MODIFICATIONS; MOLECULAR DYNAMICS METHOD; MOLYBDENUM; MOLYBDENUM SULFIDES; PHOTOLUMINESCENCE; QUENCHING; SIMULATION; SPUTTERING; SULFUR; SULFUR CONTENT; VACANCIES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; FLUIDS; GASES; IONS; LUMINESCENCE; METALS; MOLYBDENUM COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; POINT DEFECTS; RARE GASES; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS