Spatially resolved characterization of a dc magnetron plasma using optical emission spectroscopy
Creators
- 1. Institute of Electrical Engineering and Plasma Technology, Ruhr University Bochum, Universitaetsstraße 150, D-44780 Bochum (Germany)
- 2. Materials Chemistry, RWTH Aachen University, Kopernikusstraße 10, D-52074 Aachen (Germany)
Description
In this work, a reactive argon−nitrogen dc magnetron plasma for sputtering of a chromium (Cr) target is characterized with high spatial resolution by optical emission spectroscopy (OES) using molecular nitrogen emission bands at 0.5 Pa and 100 W. Beside the global gas temperature T g, the electron temperature T e, electron density n e, and the steady-state Cr density n Cr are also determined spatially resolved using a movable OES setup inside the chamber and Abel inversion. n e and T e are found to be consistent with the values measured by a Langmuir probe (LP) within the non-magnetized region along the magnetron axis in a pure Ar plasma for the same process parameters. Finally, a nitrogen content c N of 4% in the target surface is found for the reactive plasma by matching the mean steady-state chromium density measured by OES and calculated from TRIDYN simulations. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6595/aad6d9Additional details
Identifiers
Publishing Information
- Journal Title
- Plasma Sources Science and Technology
- Journal Volume
- 27
- Journal Issue
- 9
- Journal Page Range
- [16 p.]
- ISSN
- 0963-0252
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52036897
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ARGON; CHROMIUM; COMPUTERIZED SIMULATION; DENSITY; ELECTRON DENSITY; ELECTRON TEMPERATURE; EMISSION SPECTROSCOPY; LANGMUIR PROBE; MAGNETRONS; NITROGEN; PLASMA; SPATIAL RESOLUTION; STEADY-STATE CONDITIONS
- Descriptors DEC
- ELECTRIC PROBES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUIDS; GASES; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; PHYSICAL PROPERTIES; PROBES; RARE GASES; RESOLUTION; SIMULATION; SPECTROSCOPY; TRANSITION ELEMENTS