Principle and experimental investigation of current-driven negative-inductance superconducting quantum interference device
Creators
- 1. Tsinghua National Laboratory for Information Science and Technology, Tsinghua University, Beijing, 100084 (China)
- 2. Department of Physics and Astronomy, University of Kansas, Lawrence, KS 66045 (United States)
Description
A negative-inductance superconducting quantum interference device (nSQUID) is an adiabatic superconducting logic device with high energy efficiency, and therefore a promising building block for large-scale low-power superconducting computing. However, the principle of the nSQUID is not that straightforward and an nSQUID driven by voltage is vulnerable to common mode noise. We investigate a single nSQUID driven by current instead of voltage, and clarify the principle of the adiabatic transition of the current-driven nSQUID between different states. The basic logic operations of the current-driven nSQUID with proper parameters are simulated by WRspice. The corresponding circuit is fabricated with a 100 A cm−2 Nb-based lift-off process, and the experimental results at low temperature confirm the basic logic operations as a gated buffer. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6668/aa52efAdditional details
Identifiers
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 30
- Journal Issue
- 3
- Journal Page Range
- [5 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50027902
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ENERGY EFFICIENCY; INDUCTANCE; SQUID DEVICES; TEMPERATURE RANGE 0065-0273 K
- Descriptors DEC
- CURRENTS; EFFICIENCY; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; SIMULATION; SUPERCONDUCTING DEVICES; TEMPERATURE RANGE