Published March 2010
| Version v1
Journal article
Super-resolution imaging at different wavelengths by using a one-dimensional metamaterial structure
- 1. State Key Laboratory of Optical Technologies for Microfabrication, Institute of Optics and Electronics, Chinese Academy of Science, PO Box 350, Chengdu 610209 (China)
Description
A super-resolution imaging method for the deep sub-wavelength structure has been proposed, which is achieved by controlling the propagating direction of the evanescent components of the incident field through a one-dimensional metamaterial structure (ODMS) with an anisotropic dielectric permittivity. We provide the mechanism of this kind of super-resolution imaging method in detail and discuss some factors influencing image quality. A two-dimensional finite element method (FEM) has been used to verify the imaging mechanism. Furthermore, the same sub-diffraction limited image could be obtained at different incident wavelengths at the far side of the imaging structure with different working distances
Availability note (English)
Available from http://dx.doi.org/10.1088/2040-8978/12/3/035104Additional details
Identifiers
- DOI
- 10.1088/2040-8978/12/3/035104;
- PII
- S2040-8978(10)29833-6;
Publishing Information
- Journal Title
- Journal of Optics (Online)
- Journal Volume
- 12
- Journal Issue
- 3
- Journal Page Range
- [5 p.]
- ISSN
- 2040-8986
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45019194
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; DIELECTRIC MATERIALS; DIFFRACTION; FINITE ELEMENT METHOD; IMAGES; ONE-DIMENSIONAL CALCULATIONS; PERMITTIVITY; SPATIAL RESOLUTION; WAVELENGTHS
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; MATERIALS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; PHYSICAL PROPERTIES; RESOLUTION; SCATTERING