Synthesis & thermoluminescence characteristics & structural and optical studies of ZnO/Ag/ZnO system for dosimetric applications
- 1. Department of Medical Physics and Radiation Science, School of Physics, Universiti Sains Malaysia, Pulau Pinang, 11800 (Malaysia)
Description
Highlights: • ZnO/Ag/ZnO multilayer system grown successfully by (RF/DC) sputtering. • The glow curve revealed a single peak corresponding with dosimetric peak located at 230 °C. • Photoluminescence and thermoluminescence properties have been investigated. • The multilayer system demonstrates remarkable repeated irradiation reproducibility without pre-irradiation. • The best heating rate and annealing temperature and time recorded 3 °C/s, 200 °C, and 30 min. This study demonstrated a novel dosimeter ZnO/Ag/ZnO) multilayer thin films that were fabricated via radiofrequency and direct current RF/DC sputtering at room temperature. The sequence of ZnO(200 nm) Ag(x nm) ZnO(50 nm) was selected with Ag layer of varying thickness (x = 5, 10, 14, 20, 30, and 40 nm). The dosimetric properties were investigated where samples were irradiated with X-ray doses in the range of 0.01–4 Gy. The optimum TL intensity found at ZnO(200 nm), Ag(10 nm) ZnO(50 nm). The glow curve revealed a single peak, the dosimetric peak consistent to 230 °C. In contrast, the best heating rate and annealing temperature and time recorded 3 °C/s, 200 °C, and 30 min respectively. The dose-response demonstrated good linearity within the dose range of 0.01–4 Gy. The other properties have been studied, such as reused, thermal fading, and optical fading; the results in this study revealed that the new host dosimeter exhibits a suitable TL property for radiation detection. The Photoluminescence PL study depicted two sharp peaks of ZnO/Ag/ZnO multilayer thin films at both visible regions at 740–810 nm and UV region of 380 nm (band-edge), corresponding to deep-level emission (DLE) and exciton emission respectively. X-ray diffraction (XRD), field emission scanning electron microscope (FESEM), energy dispersive x-ray (EDX), and Ultra-Violet Visible (UV–Vis) were utilized to study crystalline structure, morphology, and element composites and optical properties respectively.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jlumin.2021.118097Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2021.118097;
- PII
- S0022231321002131;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 236
- Journal Page Range
- vp.
- ISSN
- 0022-2313
- CODEN
- JLUMA8
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54019333
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S61: RADIATION PROTECTION AND DOSIMETRY;
- Descriptors DEI
- DOSEMETERS; DOSIMETRY; FIELD EMISSION; GLOW CURVE; HEATING RATE; IRRADIATION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; RADIATION DETECTION; RADIATION DOSES; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; THERMOLUMINESCENCE; THICKNESS; THIN FILMS; X RADIATION; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DETECTION; DIFFRACTION; DIMENSIONS; DOSES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EMISSION; FILMS; IONIZING RADIATIONS; LUMINESCENCE; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.