Published May 15, 2001 | Version v1
Journal article

Local structure around Fe in the diluted magnetic semiconductors Ga1-xFexAs studied by x-ray absorption fine structure

  • 1. Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama 226-8503 (Japan)
  • 2. Department of Physics, State University of New York at Buffalo, Amherst, New York 14260 (United States)

Description

Extended x-ray absorption fine structure and near-edge x-ray absorption fine structure techniques are employed to investigate the local structure and valency about Fe atoms in the diluted magnetic alloy semiconductor system Ga1-xFexAs prepared by molecular-beam epitaxy under various conditions. This experiment is aimed at elucidating possible correlations between the microstructures in these diluted magnetic semiconductors and some physical properties. Our x-ray results offer direct evidence of Fe substitution for Ga sites in GaAs prepared at relatively low substrate temperatures, wherein the Ga1-xFexAs compound is mainly paramagnetic. However, the Fe impurity atoms could form small Fe clusters and/or Fe-As complexes when the samples are grown at high temperatures

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
63
Journal Issue
19
Journal Page Range
p. 195209-195209.4
ISSN
1098-0121

Optional Information

Notes
(c) 2001 The American Physical Society