Published May 15, 2000 | Version v1
Journal article Metadata-only

Development of an X-ray projection microscope using synchrotron radiation

Creators

  • 1. Radiation Research Institute, Faculty of Medicine, University of Tokyo, Bunkyo-ku, Tokyo 113-0033 Japan (Japan)
  • 2. Department of Nuclear Engineering, School of Engineering, Tokai University, Hiratsuka, Kanagawa 259-1292 Japan (Japan)
  • 3. Department of Information and Image Sciences, Faculty of Engineering, Chiba University, Chiba, Chiba 263-0022 Japan (Japan)
  • 4. Department of Physics, School of Science and Technology, Meiji University, Kawasaki, Kanagawa 214-8571 Japan (Japan)
  • 5. Tohoku University, Sendai, Miyagi 980-8577 Japan (Japan)

Description

Projection microscopy using synchrotron radiation as a light source has been developed. The system consists of a Fresnel zone plate to produce a small point source, an aperture (pinhole), a specimen holder, and a back-illuminated CCD camera. With this system, we obtained the images of EM-grids and dried mammalian cells. The resolution was estimated to be around 1.3 μm from the intensity change of 10 to 90% in the image of the edge pattern of an EM-grid

Additional details

Identifiers

DOI
10.1063/1.1291169;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 346-349
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35069976
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APERTURES; CAMERAS; CHARGE-COUPLED DEVICES; FRESNEL LENS; IMAGE PROCESSING; IMAGES; LIGHT SOURCES; MICROSCOPES; MICROSCOPY; POINT SOURCES; SAMPLE HOLDERS; SAMPLE PREPARATION; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
BREMSSTRAHLUNG; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LENSES; OPENINGS; PROCESSING; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING; SEMICONDUCTOR DEVICES

Optional Information

Notes
(c) 2000 American Institute of Physics.