Published May 1990 | Version v1
Report Restricted

Calibration procedure for irradiation tests on silicon devices

Creators

Description

A discussion of the problems of dosimetry met during the irradiation tests on silicon devices using different radiation sources is presented. The use of the PIN diode BPW 34 as calibration device is proposed. Its response at different radiation environment, bias voltages and integrated absorbed dose is thoroughly discussed. (orig.)

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
29 p.
Report number
MPI-PAE/Exp.El.--223

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
22004638
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CALIBRATION; DOSIMETRY; PHOTOCURRENTS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; SILICON; TESTING
Descriptors DEC
CURRENTS; ELECTRIC CURRENTS; ELEMENTS; RADIATION EFFECTS; SEMIMETALS