Excimer laser manipulation and pattering of gold nanoparticles on the SiO2/Si surface
Creators
- 1. Laboratoire de Procedes Laser, Groupe des Couches Minces and Departement de Genie Physique, Ecole Polytechnique C.P. 6079, succursale Centre-Ville, Montreal, Quebec H3C 3A7 (Canada)
Description
Au nanoparticles were deposited onto SiO2/Si by evaporation, after which x-ray photoelectron spectroscopy (XPS) indicated some interfacial interaction between the Au and the Si. The sample was then processed by KrF pulsed excimer laser radiation (248 nm) in air, at a fluence of ∼20 mJ/cm2. Following this laser irradiation, XPS indicated the loss of substrate/nanoparticle interaction, resulting in the loss of cluster adhesion to the substrate and the formation of larger, isolated, spherical Au particles through rapid cluster coalescence. UV-visible spectral measurements indicated the absence of a surface plasmon resonance peak before irradiation, due to the small nanoparticle size (<3 nm); however, such a peak appeared at ∼550 nm after irradiation, when the particle size increased to ∼5.5 nm. Using 200-mesh transmission electron microscope grids as irradiation masks, we obtained Au nanoparticles in the unpatterned areas after irradiation. Such Au nanoparticle patterning may be used in biomolecular detector-based plasmon image-type sensors
Additional details
Identifiers
- DOI
- 10.1063/1.1689751;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 95
- Journal Issue
- 9
- Journal Page Range
- p. 5023-5026
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36040211
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- EXCIMER LASERS; GOLD; NANOSTRUCTURES; PARTICLE SIZE; SILICON OXIDES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTRA; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; GAS LASERS; LASERS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SILICON COMPOUNDS; SIZE; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2004 American Institute of Physics.