Published June 21, 2001
| Version v1
Journal article
Soft X-ray sensitivity of a photon-counting hybrid pixel detector with a silicon sensor matrix
Creators
Description
We have tested a CMOS pixel readout circuit bump-bonded to a high resistivity silicon sensor to study the noise properties of the system and to determine the lower limit in energy for the detection of X-rays at room temperature. Our test shows that single photon counting is possible down to about 5 keV, and we obtain a mean total noise equivalent to 142 electrons on the electronics input
Additional details
Identifiers
- PII
- S0168900201008361;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 466
- Journal Issue
- 1
- Journal Page Range
- p. 142-145
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 33062731
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKGROUND NOISE; INTEGRATED CIRCUITS; KEV RANGE 01-10; MOSFET; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SENSITIVITY; SI SEMICONDUCTOR DETECTORS; SOFT X RADIATION; TEMPERATURE RANGE 0273-0400 K; THRESHOLD ENERGY; X-RAY DETECTION
- Descriptors DEC
- DETECTION; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; ENERGY; ENERGY RANGE; FIELD EFFECT TRANSISTORS; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; MOS TRANSISTORS; NOISE; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; TEMPERATURE RANGE; TRANSISTORS; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.