Published May 31, 2004
| Version v1
Journal article
Nanomachining carbon nanotubes with ion beams
Creators
- 1. Center for Microanalysis of Materials, Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801 (United States)
- 2. Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180 (United States)
Description
We demonstrate the use of 10 and 30 keV focused beams of Ga+ ions to thin, slice, weld, and alter the structure and composition of multiwalled carbon nanotubes at precise locations along the nanotube axis. This strategy of harnessing ion-beam-induced defect generation and doping could be attractive for modulating chemical and electrical properties along the nanotube length, and fabricate nanotube heterostructures and networks for device applications
Additional details
Identifiers
- DOI
- 10.1063/1.1756191;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 84
- Journal Issue
- 22
- Journal Page Range
- p. 4484-4486
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36047720
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON; CHEMICAL ANALYSIS; ELECTRICAL PROPERTIES; GALLIUM IONS; ION BEAMS; KEV RANGE 10-100; NANOTUBES; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PHYSICAL PROPERTIES
Optional Information
- Notes
- (c) 2004 American Institute of Physics.