The effects of deformation conditions on microstructure and texture of commercially pure Ti
- 1. Advanced Manufacturing Technology Center, China Academy of Machinery Science and Technology, 100083 Beijing (China)
- 2. Department of Materials Science and Engineering, Royal Institute of Technology, SE-10044 Stockholm (Sweden)
- 3. Norwegian University of Science and Technology, Department of Materials Science and Engineering, N-7491 Trondheim (Norway)
Description
Electron backscattered diffraction is employed to explore the influence of deformation conditions on microstructure and texture evolution of commercially pure Ti after hot compression tests. {101-bar 2} twinning is active at the beginning of deformation whereas {101-bar 1} twinning appears later. Three peaks are found in the misorientation frequency-distribution corresponding to basal fiber texture, {101-bar 1} and {101-bar 2} twinning, respectively. {101-bar 1} twins and small subgrain sizes can only be found above log Z = 13, suggesting that {101-bar 1} twinning may be a key factor for effectively reducing the deformed grain size. After deformation, two texture components can be found with compression direction 20-30 deg. or 45 deg. to [0 0 0 1]. The Schmid factors show that all slip systems, apart from the basal slip system, are active at the early stage of deformation. At heavy deformation, the basal, first- and second-order pyramidal slip systems are active.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2009.08.016Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2009.08.016;
- PII
- S1359-6454(09)00510-2;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 57
- Journal Issue
- 19
- Journal Page Range
- p. 5822-5833
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43039034
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; COMPRESSION; DEFORMATION; DISTRIBUTION; ELECTRON DIFFRACTION; ELECTRONS; FIBERS; GRAIN SIZE; PEAKS; TEXTURE; TWINNING
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MICROSTRUCTURE; SCATTERING; SIZE
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.