Published November 2009 | Version v1
Journal article

The effects of deformation conditions on microstructure and texture of commercially pure Ti

  • 1. Advanced Manufacturing Technology Center, China Academy of Machinery Science and Technology, 100083 Beijing (China)
  • 2. Department of Materials Science and Engineering, Royal Institute of Technology, SE-10044 Stockholm (Sweden)
  • 3. Norwegian University of Science and Technology, Department of Materials Science and Engineering, N-7491 Trondheim (Norway)

Description

Electron backscattered diffraction is employed to explore the influence of deformation conditions on microstructure and texture evolution of commercially pure Ti after hot compression tests. {101-bar 2} twinning is active at the beginning of deformation whereas {101-bar 1} twinning appears later. Three peaks are found in the misorientation frequency-distribution corresponding to basal fiber texture, {101-bar 1} and {101-bar 2} twinning, respectively. {101-bar 1} twins and small subgrain sizes can only be found above log Z = 13, suggesting that {101-bar 1} twinning may be a key factor for effectively reducing the deformed grain size. After deformation, two texture components can be found with compression direction 20-30 deg. or 45 deg. to [0 0 0 1]. The Schmid factors show that all slip systems, apart from the basal slip system, are active at the early stage of deformation. At heavy deformation, the basal, first- and second-order pyramidal slip systems are active.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2009.08.016

Additional details

Identifiers

DOI
10.1016/j.actamat.2009.08.016;
PII
S1359-6454(09)00510-2;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
57
Journal Issue
19
Journal Page Range
p. 5822-5833
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43039034
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BACKSCATTERING; COMPRESSION; DEFORMATION; DISTRIBUTION; ELECTRON DIFFRACTION; ELECTRONS; FIBERS; GRAIN SIZE; PEAKS; TEXTURE; TWINNING
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MICROSTRUCTURE; SCATTERING; SIZE

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.