Magnetic oscillations in semiconductor polycrystals and powders with 2D-conductivity channels
Creators
- 1. Institute of Radiophysics and Electronics of the National Academy of Sciences (Ukraine)
- 2. Royal Melbourne Institute of Technology, VIC (Australia)
Description
It is shown that magnetic oscillations, i.e. de Haas-van Alphen and Shubnikov-de Haas effects can be observed in semiconductor polycrystals or powders with two-dimensional conductivity channels on grain boundaries or on the surface of crystal particles (in the case of powder). The requirements for the experimental observation of magnetic oscillations are discussed. For typical values of the surface concentration of carriers of 1011-1012 cm-2, oscillations exist in the high magnetic field of 1-10 T. To detect the oscillations of kinetic characteristics (SdH effect) the sample must satisfy two additional requirements, namely, 2D-channels must constitute a conduction cluster penetrating through the whole sample, and the sample thickness must not exceed an average grain size
Additional details
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 246-247
- Journal Page Range
- p. 278-281
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 5. international symposium on research in high magnetic fields
- Acronym
- RHMF'97
- Dates
- 4-6 Aug 1997
- Place
- Sydney, NSW (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Australia
- INIS RN
- 33024390
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DE HAAS-VAN ALPHEN EFFECT; ELECTRIC CONDUCTIVITY; ELECTRON CHANNELING; GRAIN BOUNDARIES; N-TYPE CONDUCTORS; OSCILLATIONS; POLYCRYSTALS; POWDERS; SEMICONDUCTOR MATERIALS; SHUBNIKOV-DE HAAS EFFECT
- Descriptors DEC
- CHANNELING; CRYSTALS; ELECTRICAL PROPERTIES; MATERIALS; MICROSTRUCTURE; PHYSICAL PROPERTIES; SEMICONDUCTOR MATERIALS
Optional Information
- Copyright
- Copyright (c) 1998 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.
- Notes
- 9 refs, 2 figs