Published 1989
| Version v1
Book
Surface lattice strain and the electronic structure of thin mercury overlayers
Creators
- 1. Dept. of Physics, Syracuse Univ., Syracuse, NY (USA)
- 2. Dept. of Physics, Univ. of Wisconsin, Madison, WI (USA)
Description
In the stress in the surface of a thin (0-10) monolayer) film of mercury can be relived by either changing the substrate and consequently changing adlayer lattice constants or by growing thicker films. An empirical relationship between strain and the valence electronic structure of mercury overlayers can be demonstrated. The authors present evidence that this relationship can be altered and destroyed by crystallography changes
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 1-55899-016-X
- Imprint Title
- Synchrotron radiation in materials research
- Imprint Pagination
- 304 p.
- Series
- Materials Research Society symposium proceedings. Volume 143.
- Journal Page Range
- p. 85-90.
Conference
- Title
- Synchrotron radiation in materials research.
- Dates
- 28-30 Nov 1988.
- Place
- Boston, MA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21042592
- Subject category
- S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL LATTICES; CRYSTALLOGRAPHY; ELECTRONIC STRUCTURE; LATTICE PARAMETERS; LAYERS; MERCURY; THIN FILMS
- Descriptors DEC
- CRYSTAL STRUCTURE; ELEMENTS; FILMS; METALS
Optional Information
- Secondary number(s)
- CONF-8811224--.