Published 1989 | Version v1
Book

Surface lattice strain and the electronic structure of thin mercury overlayers

  • 1. Dept. of Physics, Syracuse Univ., Syracuse, NY (USA)
  • 2. Dept. of Physics, Univ. of Wisconsin, Madison, WI (USA)

Description

In the stress in the surface of a thin (0-10) monolayer) film of mercury can be relived by either changing the substrate and consequently changing adlayer lattice constants or by growing thicker films. An empirical relationship between strain and the valence electronic structure of mercury overlayers can be demonstrated. The authors present evidence that this relationship can be altered and destroyed by crystallography changes

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (USA)
ISBN
1-55899-016-X
Imprint Title
Synchrotron radiation in materials research
Imprint Pagination
304 p.
Series
Materials Research Society symposium proceedings. Volume 143.
Journal Page Range
p. 85-90.

Conference

Title
Synchrotron radiation in materials research.
Dates
28-30 Nov 1988.
Place
Boston, MA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21042592
Subject category
S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL LATTICES; CRYSTALLOGRAPHY; ELECTRONIC STRUCTURE; LATTICE PARAMETERS; LAYERS; MERCURY; THIN FILMS
Descriptors DEC
CRYSTAL STRUCTURE; ELEMENTS; FILMS; METALS

Optional Information

Secondary number(s)
CONF-8811224--.