Published May 2003 | Version v1
Journal article

Electron impact ionization of Kr10+-Kr18+ ions

Description

Cross-sections for single ionization of Kr10+-Kr18+ ions by electron impact are calculated in the Coulomb-Born approximation by the code 'ATOM' and compared with experimental data and with other theoretical results for charge states 10 and 18. Single electron impact ionization is sum of the contributions from direct ionization and from excitation of the autoionizing levels. Direct ionization includes ionization from 3s, 3p and 3d shells only since ionization from 1s, 2s, 2p results in double ionization. The autoionizing levels 2s 2p6 3s2 3p6 3dm nl and 2s2 2p5 3s2 3p6 3dm nl decay via autoionization and finally contribute to single ionization. The results are found to be in satisfactory agreement with experimental results obtained in a crossed electron-ion beam experiment. The case of ions formed in metastable states is studied for Kr18+ where it was observed in the experiments

Additional details

Identifiers

PII
S0168583X03005639;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
205
Journal Issue
1-4
Journal Page Range
p. 427-432
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
11. international conference on the physics of highly charged ions
Dates
1-6 Sep 2002
Place
Caen (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34077492
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AUTOIONIZATION; BORN APPROXIMATION; COLLIDING BEAMS; CROSS SECTIONS; ELECTRON-ION COLLISIONS; ELECTRONIC STRUCTURE; IONIZATION; KRYPTON IONS; METASTABLE STATES; MULTICHARGED IONS
Descriptors DEC
BEAMS; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ENERGY LEVELS; EXCITED STATES; ION COLLISIONS; IONIZATION; IONS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.