Published November 2007
| Version v1
Journal article
Quantitative determination of magnetic fields on object surfaces via photoemission electron microscopy without restriction of the electron beam
- 1. Institute of Physics, National Academy of Sciences of Ukraine, pr.Nauki 46, 03039 Kiev (Ukraine)
- 2. Institute of Physics, University Mainz, Staudingerweg 7, 55099 Mainz (Germany)
Description
The stray magnetic field of domains on the surface of Nd17Fe17Cu5B5 and SmFe10Ti89 samples was visualized by emission electron microscopy in the regime without restriction of the electron rays by a contrast aperture. The distribution of the tangential and normal components of the magnetic field on the surface under study was derived from the image contrast. The experimental uncertainty of the performed quantitative measurements of the magnetic field is estimated as 15-20%, however, the applied technique has a principal error that is several times smaller
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2007.08.076Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2007.08.076;
- PII
- S0168-583X(07)01472-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 264
- Journal Issue
- 1
- Journal Page Range
- p. 194-200
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39051476
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- APERTURES; DISTRIBUTION; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRONS; ERRORS; IMAGES; MAGNETIC FIELDS; PHOTOEMISSION; SURFACES
- Descriptors DEC
- BEAMS; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; OPENINGS; PARTICLE BEAMS; SECONDARY EMISSION
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.