Published November 2007 | Version v1
Journal article

Quantitative determination of magnetic fields on object surfaces via photoemission electron microscopy without restriction of the electron beam

  • 1. Institute of Physics, National Academy of Sciences of Ukraine, pr.Nauki 46, 03039 Kiev (Ukraine)
  • 2. Institute of Physics, University Mainz, Staudingerweg 7, 55099 Mainz (Germany)

Description

The stray magnetic field of domains on the surface of Nd17Fe17Cu5B5 and SmFe10Ti89 samples was visualized by emission electron microscopy in the regime without restriction of the electron rays by a contrast aperture. The distribution of the tangential and normal components of the magnetic field on the surface under study was derived from the image contrast. The experimental uncertainty of the performed quantitative measurements of the magnetic field is estimated as 15-20%, however, the applied technique has a principal error that is several times smaller

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2007.08.076

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.08.076;
PII
S0168-583X(07)01472-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
264
Journal Issue
1
Journal Page Range
p. 194-200
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39051476
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
APERTURES; DISTRIBUTION; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRONS; ERRORS; IMAGES; MAGNETIC FIELDS; PHOTOEMISSION; SURFACES
Descriptors DEC
BEAMS; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; OPENINGS; PARTICLE BEAMS; SECONDARY EMISSION

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.