Published February 1, 2011 | Version v1
Journal article

Pressure effects in Debye-Waller factors and in EXAFS

  • 1. University of Science, VNU Hanoi, 334 Nguyen Trai, Thanh Xuan, Hanoi (Viet Nam)
  • 2. Hanoi National University of Education, 136 Xuan Thuy, Cau Giay, Hanoi (Viet Nam)
  • 3. National University of Civil Engineering, 55 Giai Phong, Hai Ba Trung, Hanoi (Viet Nam)
  • 4. Bergische Universitaet-Gesamthochschule Wuppertal, FB: 8-Physik, Gauss Strasse 20, 42097 Wuppertal (Germany)

Description

Anharmonic correlated Einstein model (ACEM) and statistical moment method (SMM) have been developed to derive analytical expressions for pressure dependence of the lattice bond length, effective spring constant, correlated Einstein frequency and temperature, Debye-Waller factors (DWF) or second cumulant, first and third cumulants in Extended X-ray Absorption Fine Structure (EXAFS) at a given temperature. Numerical results for pressure-dependent DWF of Kr and Cu agree well with experiment and other theoretical values. Simulated EXAFS of Cu and its Fourier transform magnitude using our calculated pressure-induced change in the 1st shell are found to be in a reasonable agreement with those using X-ray diffraction (XRD) experimental results. -- Research Highlights: → We have developed anharmonic correlated Einstein model and statistical moment method. → The pressure effects in cumulants including DWF and in EXAFS has been investigated. → Calculated pressure-dependent DWF for Kr, Cu agree with experiment and other results. → Simulated EXAFS and Fourier transform magnitude of Cu agree with those using XRD data.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2010.11.012

Additional details

Identifiers

DOI
10.1016/j.physb.2010.11.012;
PII
S0921-4526(10)01067-7;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
406
Journal Issue
3
Journal Page Range
p. 456-460
ISSN
0921-4526
CODEN
PHYBE3

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.