Published June 1, 1987 | Version v1
Journal article

A high-pressure single-crystal X-ray diffraction study of V3O5 including the phase transition at 6.2 GPa

  • 1. Stockholm Univ. (Sweden). Arrhenius Labs.
  • 2. Polska Akademia Nauk, Wroclaw. Inst. Niskich Temperatur i Badan Strukturalnych

Description

The unit-cell parameters of the mixed-valence oxide V3O5 have been studied as functions of pressure from 0.3 up to 7.5 GPa in a single-crystal experiment involving measurements at 21 different pressure values. A diamond-anvil high-pressure (h.p.) cell of new construction mounted on a four-circle X-ray diffractometer was used. At Pt=6.25(9) GPa a phase transition was observed at room temperature. This is analogous to the semiconductor-metal transition observed at Tt=428 K and normal pressure, which implies a change in the ordering of the metal-atom valencies. The linear Eulerian strain tensor for the transition has been calculated. The bulk modulus K has been determined for the low-pressure (l.p.) as well as for the h.p. phase: Kl.p.(0.3-5.5 GPa)=269(3), Kh.p.(6.3-7.5 GPa)=175(11) GPa. Certain anomalies in the cell-parameter values in a small pressure interval around the phase transition indicate a preparation in the crystal structure for the transition in both the l.p. and the h.p. phase. (orig.)

Additional details

Publishing Information

Journal Title
J. Appl. Crystallogr.
Journal Volume
20
Journal Issue
3
Series
J. Appl. Crystallogr.
Journal Page Range
195-199
ISSN
0021-8898
CODEN
JACGA