Published August 1994 | Version v1
Journal article

Results of radiation hardness tests and performance tests of the HS9008RH flash ADC

  • 1. Univ. of Michigan, Ann Arbor, MI (United States). Physics Dept.
  • 2. Ames Lab., IA (United States)
  • 3. Iowa State Univ., Ames, IA (United States). Dept. of Physics and Astronomy

Description

Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital converter (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV γ radiation from a 60Co source. Exposure of the device to a reactor fast neutron fluence (E > 100keV) of 5 x 1014/cm2 resulted in no significant observed performance degradation as well

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
41
Journal Issue
4Pt1
Journal Page Range
p. 1197-1202.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
nuclear science symposium and medical imaging conference.
Acronym
NSS-MIC '93
Dates
30 Oct - 6 Nov 1993.
Place
San Francisco, CA (United States).

Optional Information

Secondary number(s)
CONF-931051--.