Published October 1982 | Version v1
Journal article

Defects in silicon near the Si-SiO2 interface produced by Si+ ions implantation

  • 1. AN SSSR, Moscow. Fizicheskij Inst.

Description

The influence of cation impurities on radiation-induced processes in alkali halides is critically reviewed. A number of different effects are considered. First, changes in the charge location in the lattice and state of aggregation of the impurity brought about by irradiation are discussed. Next, the available information on the structure and mechanisms of formation of defect centres (Fsub(A), Fsub(Z) and V) associated to the impurities are analyzed. Finally, the role of impurities on the production of intrinsic F and F2 color centers is reviewed. Here three temperature ranges (low, medium and high) are separately considered. Particular attention has been paid to the effect of impurities on the primary process of defect creation, as revealed by fast pulse irradiation experiments. 254 references. (author)

Additional details

Publishing Information

Journal Title
Nuclear Safety
Journal Volume
9
Journal Issue
4
Series
Cryst. Lattice Defects.
Journal Page Range
189-194
ISSN
0011-2305