Published January 1989
| Version v1
Journal article
Application of the fundamental-parameters method in x-ray fluorescence analysis
Creators
- 1. Academia Sinica, Beijing, BJ (China). Inst. of Atomic Energy
Description
Alloy samples are excited with the radioisotope source and measured by X-ray spectrometer using the fundamental-parameters method without chemical treatment and refernce standared material. The data are processed by the microcomputer-EMG666. The change of the incident angles, the first fluorescent effect the secondary fluorescent effect and scattering effect are studied. The accuracy and the precision of this method is less than +-3% and +-6%, respectively
Additional details
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 23
- Journal Issue
- 1
- Series
- At. Energy Sci. Technol.
- Journal Page Range
- 15-19
- ISSN
- 1000-6931
- CODEN
- YKJIE
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 21042238
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACCURACY; FLUORESCENCE; INCIDENCE ANGLE; ITERATIVE METHODS; MULTI-PARAMETER ANALYSIS; QUANTITY RATIO; SCATTERING; STEEL-CR18NI9TI; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALLOYS; AUSTENITIC STEELS; CARBON ADDITIONS; CHEMICAL ANALYSIS; CHROMIUM ALLOYS; CHROMIUM-NICKEL STEELS; CORROSION RESISTANT ALLOYS; EMISSION; HEAT RESISTING ALLOYS; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; LUMINESCENCE; NICKEL ALLOYS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; STAINLESS STEELS; STEELS; TITANIUM ADDITIONS; X-RAY EMISSION ANALYSIS