Imaging X-ray fluorescence spectroscopy: laboratory measurements
Creators
Description
Following on from the proof-of principle measurements of Martin et al. (X-ray Spectrom. 28 (1999) 64) we further describe the development of an imaging X-ray fluorescence (IXRF) spectrometer with no moving parts. Our laboratory system is based on a microchannel plate (MCP) 'lens', a CCD X-ray detector with good sub-keV quantum efficiency and a conventional electron bombardment X-ray source. We have used this equipment to form images of a standard XRF target, demonstrating that 'elemental maps' (images of the target in the characteristic X-rays of one particular element) may be formed with sub-millimetre resolution. In addition to fluorescent X-rays, we detected X-rays which had been Bragg reflected from the polycrystalline aluminium substrate of the target. It is possible that the resulting 'Bragg images' may be exploited to measure spatially varying strain, manifested as lattice distortion, introduced, for example, by thin films deposited on the surface of a sample
Additional details
Identifiers
- PII
- S0168900200010767;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 460
- Journal Issue
- 2-3
- Journal Page Range
- p. 316-325
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 33047597
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALUMINIUM; BRAGG REFLECTION; CHARGE-COUPLED DEVICES; ELECTROSTATIC LENSES; PHOTON TRANSPORT; POLYCRYSTALS; POSITION SENSITIVE DETECTORS; SPATIAL RESOLUTION; SUBSTRATES; TARGET CHAMBERS; THIN FILMS; X-RAY DETECTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES; X-RAY SPECTROMETERS
- Descriptors DEC
- ACCELERATOR FACILITIES; CHEMICAL ANALYSIS; CRYSTALS; DETECTION; ELEMENTS; FILMS; LENSES; MEASURING INSTRUMENTS; METALS; NEUTRAL-PARTICLE TRANSPORT; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; RADIATION TRANSPORT; REFLECTION; RESOLUTION; SEMICONDUCTOR DEVICES; SPECTROMETERS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.