Published October 2004 | Version v1
Journal article

X-ray spectroscopy for high energy-density X pinch density and temperature measurements (invited)

  • 1. Physics Department, University of Nevada, Reno, Nevada 89557 (United States)
  • 2. Multicharged Ion Spectra Data Center, VNIIFTRI, Mendeleevo, Moscow Region (Russian Federation)
  • 3. Laboratory of Plasmas Studies, Cornell University, Ithaca, New York 14853 (United States)

Description

X pinch plasmas produced from fine metal wires can reach near solid densities and temperatures of 1 keV or even more. Plasma conditions change on time scales as short as 5-10 ps as determined using an x-ray streak camera viewing a focusing crystal spectrograph or directly viewing the plasma through multiple filters on a single test. As a result, it is possible to determine plasma conditions from spectra with ∼10 ps time resolution. Experiments and theory are now coming together to give a consistent picture of the dynamics and kinetics of these high energy density plasmas with very high temporal and spatial precision. A set of diagnostic techniques used in experiments for spectrally, temporally, and spatially resolved measurements of X pinch plasmas is described. Results of plasma parameter determination from these measurements are presented. X ray backlighting of one x-pinch by another with ∼30 ps x-ray pulses enables the dynamics and kinetics to be correlated in time

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
75
Journal Issue
10
Journal Page Range
p. 3666-3671
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2004 American Institute of Physics