X-ray spectroscopy for high energy-density X pinch density and temperature measurements (invited)
Creators
- 1. Physics Department, University of Nevada, Reno, Nevada 89557 (United States)
- 2. Multicharged Ion Spectra Data Center, VNIIFTRI, Mendeleevo, Moscow Region (Russian Federation)
- 3. Laboratory of Plasmas Studies, Cornell University, Ithaca, New York 14853 (United States)
Description
X pinch plasmas produced from fine metal wires can reach near solid densities and temperatures of 1 keV or even more. Plasma conditions change on time scales as short as 5-10 ps as determined using an x-ray streak camera viewing a focusing crystal spectrograph or directly viewing the plasma through multiple filters on a single test. As a result, it is possible to determine plasma conditions from spectra with ∼10 ps time resolution. Experiments and theory are now coming together to give a consistent picture of the dynamics and kinetics of these high energy density plasmas with very high temporal and spatial precision. A set of diagnostic techniques used in experiments for spectrally, temporally, and spatially resolved measurements of X pinch plasmas is described. Results of plasma parameter determination from these measurements are presented. X ray backlighting of one x-pinch by another with ∼30 ps x-ray pulses enables the dynamics and kinetics to be correlated in time
Additional details
Identifiers
- DOI
- 10.1063/1.1788863;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 75
- Journal Issue
- 10
- Journal Page Range
- p. 3666-3671
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36080048
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- COPPER; ELECTRON TEMPERATURE; ENERGY DENSITY; ION TEMPERATURE; KEV RANGE 01-10; MOLYBDENUM; NICKEL; PLASMA DENSITY; PLASMA DIAGNOSTICS; STREAK CAMERAS; TEMPERATURE MEASUREMENT; TIME RESOLUTION; X-RAY SPECTROSCOPY; ZINC
- Descriptors DEC
- CAMERAS; ELEMENTS; ENERGY RANGE; KEV RANGE; METALS; REFRACTORY METALS; RESOLUTION; SPECTROSCOPY; TIMING PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2004 American Institute of Physics