Published November 22, 2005
| Version v1
Journal article
A liquid-liquid interface technique to form films of CuO nanowhiskers
Creators
- 1. Defence Materials and Stores Research and Development Establishment, DMSRDE (P.O.), G.T. Road, Kanpur, 208013 (India)
Description
Films of CuO nanowhiskers with diameters in the range of 50 to 300 nm and lengths of up to several microns were prepared by employing reactions at the liquid-liquid interface. In this method, a precursor of copper acetyl-acetonate taken in the toluene layer reacts at the interface with hydrolyzing agent in the aqueous layer, at a temperature of about 50 deg. C. The crystallinity, purity, morphology and structural features of the as-prepared film were studied by using X-ray diffraction, transmission electron microscopy and scanning electron microscopy. Results reveal that the film obtained is of densely packed nanowhiskers with large aspect ratios and having a crystallinity of monoclinic CuO
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.04.122;
- PII
- S0040-6090(05)01159-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 491
- Journal Issue
- 1-2
- Journal Page Range
- p. 168-172
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37023095
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER OXIDES; IMPURITIES; INTERFACES; LAYERS; LIQUIDS; MONOCLINIC LATTICES; MORPHOLOGY; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; WHISKERS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; FLUIDS; MATERIALS; MICROSCOPY; MONOCRYSTALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.