Published August 15, 2013 | Version v1
Journal article Metadata-only

Fundamental characteristics of hybrid X-ray focusing optics for micro X-ray fluorescence analysis

Creators

  • 1. Horiba Ltd., 2 Miyanohigashi, Kisshoin, Minami-ku, Kyoto 601-8510 (Japan)
  • 2. Department of Applied Chemistry and Bioengineering, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi, Osaka 558-8585 (Japan)

Description

We developed a hybrid X-ray focusing optics, which consisted of a polycapillary X-ray lens (PCXL) and a tungsten conical pinhole (WCP) for micro X-ray fluorescence (μ-XRF) analysis. A single PCXL produced an X-ray micro beam with a spot size of 12 μm. We developed a WCP by using a laser-ablation technique with an input diameter of 39 μm, an output diameter of 2.5 μm, and a thickness of 0.5 mm in a conical shape. This hybrid X-ray optics gave a small spot size of 2.8 μm with a small divergent angle of 12 mrad

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2013.02.023

Additional details

Identifiers

DOI
10.1016/j.nimb.2013.02.023;
PII
S0168-583X(13)00264-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
309
Journal Page Range
p. 260-263
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
5. international conference on charged and neutral particles channeling phenomena
Acronym
Channeling 2012
Dates
23-28 Sep 2012
Place
Alghero, Sardinia (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45065423
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABLATION; BEAMS; FLUORESCENCE; FOCUSING; HYBRIDIZATION; LASERS; LENSES; MAPPING; OPTICS; THICKNESS; TUNGSTEN; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; METALS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.