Published August 1, 2000
| Version v1
Report
New synchrotron-radiation based technique to study localized defects in silicon: 'EBIC' with X-ray excitation
Description
no abstract available
Availability note (English)
Available from www.als.lbl.govAdditional details
Publishing Information
- Imprint Pagination
- [vp.]
- Report number
- LBNL/ALS--43453
Conference
- Title
- 10. Workshop on Crystalline Silicon Solar Cell Materials and Processes
- Dates
- 14-16 Aug 2000
- Place
- Copper Mountain, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 33061273
- Subject category
- S43: PARTICLE ACCELERATORS; S14: SOLAR ENERGY;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- ADVANCED LIGHT SOURCE; DEFECTS; EXCITATION; SILICON; SILICON SOLAR CELLS; SYNCHROTRON RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATION SOURCES; RADIATIONS; SEMIMETALS; SOLAR CELLS; SOLAR EQUIPMENT; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Contract/Grant/Project number
- AC03-76SF00098
- Funding organization
- US Department of Energy (United States)