Correlated analysis of 2 MeV proton-induced radiation damage in CdZnTe crystals using photoluminescence and thermally stimulated current techniques
Creators
- 1. Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072 (China)
- 2. State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072 (China)
- 3. Institute of Modern Physics, Applied Ion Beam Physics Laboratory, Fudan University, Shanghai 200433 (China)
- 4. Materials Research Center, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000 (China)
Description
Highlights: • 2 MeV proton-induced radiation damage in CdZnTe crystals is investigated by PL and TSC techniques. • The influence of radiation damage on the luminescent and electrical properties of CdZnTe crystals is studied. • Intensity of PL spectrum is found to decrease significantly in irradiated regions, suggesting the increase of non-radiative recombination centers. • A correlated analysis of PL and TSC spectra suggests that the density of dislocations and A-centers increase after proton irradiation. - Abstract: Radiation damage induced by 2 MeV protons in CdZnTe crystals has been studied by means of photoluminescence (PL) and thermally stimulated current (TSC) techniques. A notable quenching of PL intensity is observed in the regions irradiated with a fluence of 6 × 1013 p/cm2, suggesting the increase of non-radiative recombination centers. Moreover, the intensity of emission peak Dcomplex centered at 1.48 eV dominates in the PL spectrum obtained from irradiated regions, ascribed to the increase of interstitial dislocation loops and A centers. The intensity of TSC spectra in irradiated regions decreases compared to the virgin regions, resulting from the charge collection inefficiency caused by proton-induced recombination centers. By comparing the intensity of identified traps obtained from numerical fitting using simultaneous multiple peak analysis (SIMPA) method, it suggests that proton irradiation under such dose can introduce high density of dislocation and A-centers in CdZnTe crystals, consistent with PL results.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2016.09.001Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2016.09.001;
- PII
- S0168-583X(16)30375-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 386
- Journal Page Range
- p. 16-21
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48071366
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- A CENTERS; CDZNTE SEMICONDUCTOR DETECTORS; CHARGE COLLECTION; COMPARATIVE EVALUATIONS; CRYSTALS; DENSITY; DISLOCATIONS; ELECTRICAL PROPERTIES; INTERSTITIALS; IRRADIATION; MEV RANGE 01-10; PHOTOLUMINESCENCE; PROTONS; QUENCHING; RADIATION DOSES; RADIATION EFFECTS; RECOMBINATION; SPECTRA
- Descriptors DEC
- BARYONS; COLOR CENTERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DOSES; ELEMENTARY PARTICLES; EMISSION; ENERGY RANGE; EVALUATION; FERMIONS; HADRONS; LINE DEFECTS; LUMINESCENCE; MEASURING INSTRUMENTS; MEV RANGE; NUCLEONS; PHOTON EMISSION; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; VACANCIES
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.