Published September 1992 | Version v1
Journal article

Doppler shift measurements of ion energy distribution widths in an electron cyclotron resonance/multipole hybrid reactor

  • 1. IBM Technology Products Division, Hopewell Junction, New York 12533 (United States)
  • 2. Oak Ridge National Laboratory, Solid State Division, Oak Ridge, Tennessee 37831 (United States)

Description

An optical emission spectroscopy diagnostic was used to measure the Doppler broadening of a Cl+ emission line in a plasma generated in an electron cyclotron resonance/multipole hybrid reactor. The broadening of the emission line was found to be correlated with Langmuir probe measurements of the electron temperature. It is postulated that the Doppler broadening is related to the electron temperature through the plasma potential. Deviations to the correlation occur at high microwave powers, suggesting the existence of another type of ion broadening

Additional details

Publishing Information

Journal Title
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
Journal Volume
10
Journal Issue
5
Journal Page Range
p. 3114-3118.
ISSN
0734-2101
CODEN
JVTAD6