Published September 1992
| Version v1
Journal article
Doppler shift measurements of ion energy distribution widths in an electron cyclotron resonance/multipole hybrid reactor
- 1. IBM Technology Products Division, Hopewell Junction, New York 12533 (United States)
- 2. Oak Ridge National Laboratory, Solid State Division, Oak Ridge, Tennessee 37831 (United States)
Description
An optical emission spectroscopy diagnostic was used to measure the Doppler broadening of a Cl+ emission line in a plasma generated in an electron cyclotron resonance/multipole hybrid reactor. The broadening of the emission line was found to be correlated with Langmuir probe measurements of the electron temperature. It is postulated that the Doppler broadening is related to the electron temperature through the plasma potential. Deviations to the correlation occur at high microwave powers, suggesting the existence of another type of ion broadening
Additional details
Publishing Information
- Journal Title
- Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
- Journal Volume
- 10
- Journal Issue
- 5
- Journal Page Range
- p. 3114-3118.
- ISSN
- 0734-2101
- CODEN
- JVTAD6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24013340
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CHLORINE IONS; DOPPLER BROADENING; ELECTRON CYCLOTRON-RESONANCE; ELECTRON TEMPERATURE; EMISSION SPECTROSCOPY; ION SPECTROSCOPY; LANGMUIR PROBE; MULTIPOLES; PLASMA; PLASMA DIAGNOSTICS; PLASMA POTENTIAL
- Descriptors DEC
- CHARGED PARTICLES; CYCLOTRON RESONANCE; ELECTRIC POTENTIAL; ELECTRIC PROBES; IONS; LINE BROADENING; PROBES; RESONANCE; SPECTROSCOPY