Corrosion on silicon sensors
- 1. IEKP, Institut fuer Experimentelle Kernphysik, Universitaet Karlsruhe - TH (Germany) and CERN, Department PH-CMT (Switzerland)
- 2. HEPHY, Institut fuer Hochenergiephysik, Vienna (Austria)
- 3. GRPHE, Groupe de Recherches en Physique des Hautes Energies, University of Mulhouse (France)
- 4. IEKP, Institut fuer Experimentelle Kernphysik, Universitaet Karlsruhe - TH (Germany)
Description
The CMS tracking detector uses about 26000 silicon sensors to equip 206m2 of silicon [F. Hartmann, et al., Nucl. Instr. and Meth. A 478 (2002); J.L. Agram, et al., Nucl. Instr. and Meth. A 517 (2004) 77]. During our quality and process control, including long term testing of the silicon sensors, strange stains on the guard and bias rings have been observed. The result of a systematic investigation proved that our detectors are affected by Al2O3 corrosion after time under voltage in a humid environment. Depth profiling showed that the metal structures are compromised down to the level of SiO2. Finally, significant concentrations of potassium (K) were found precisely at the location of the corrosion, serving as a catalyst for the electrochemical reaction. A systematic study and origin of these stains will be presented
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.09.078;
- PII
- S0168-9002(06)01600-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 569
- Journal Issue
- 1
- Journal Page Range
- p. 80-83
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 14. international workshop on vertex detectors
- Acronym
- VERTEX 2005
- Dates
- 7-11 Nov 2005
- Place
- Nikko, Tochigi (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38038123
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; CATALYSTS; CORROSION; ELECTRIC POTENTIAL; POTASSIUM; PROCESS CONTROL; SI SEMICONDUCTOR DETECTORS; SILICON; SILICON OXIDES; TESTING
- Descriptors DEC
- ALKALI METALS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; CONTROL; ELEMENTS; MEASURING INSTRUMENTS; METALS; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.