Published December 10, 2006 | Version v1
Journal article

Corrosion on silicon sensors

  • 1. IEKP, Institut fuer Experimentelle Kernphysik, Universitaet Karlsruhe - TH (Germany) and CERN, Department PH-CMT (Switzerland)
  • 2. HEPHY, Institut fuer Hochenergiephysik, Vienna (Austria)
  • 3. GRPHE, Groupe de Recherches en Physique des Hautes Energies, University of Mulhouse (France)
  • 4. IEKP, Institut fuer Experimentelle Kernphysik, Universitaet Karlsruhe - TH (Germany)

Description

The CMS tracking detector uses about 26000 silicon sensors to equip 206m2 of silicon [F. Hartmann, et al., Nucl. Instr. and Meth. A 478 (2002); J.L. Agram, et al., Nucl. Instr. and Meth. A 517 (2004) 77]. During our quality and process control, including long term testing of the silicon sensors, strange stains on the guard and bias rings have been observed. The result of a systematic investigation proved that our detectors are affected by Al2O3 corrosion after time under voltage in a humid environment. Depth profiling showed that the metal structures are compromised down to the level of SiO2. Finally, significant concentrations of potassium (K) were found precisely at the location of the corrosion, serving as a catalyst for the electrochemical reaction. A systematic study and origin of these stains will be presented

Additional details

Identifiers

DOI
10.1016/j.nima.2006.09.078;
PII
S0168-9002(06)01600-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
569
Journal Issue
1
Journal Page Range
p. 80-83
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
14. international workshop on vertex detectors
Acronym
VERTEX 2005
Dates
7-11 Nov 2005
Place
Nikko, Tochigi (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38038123
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM OXIDES; CATALYSTS; CORROSION; ELECTRIC POTENTIAL; POTASSIUM; PROCESS CONTROL; SI SEMICONDUCTOR DETECTORS; SILICON; SILICON OXIDES; TESTING
Descriptors DEC
ALKALI METALS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; CONTROL; ELEMENTS; MEASURING INSTRUMENTS; METALS; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.