Structural and magnetic properties of FePt film with Cu top layer diffusion
Creators
- 1. Data Storage Institute, DSI Building, 5 Engineering Drive 1, Singapore 117608 (Singapore)
Description
The top or bottom layer diffusion through grain boundary is believed to be one promising method for magnetic isolation. In the paper, the effects of the Cu top layer thickness and thus annealing time on the structural and magnetic properties of the FePt (001) film were investigated. The XPS in-depth profile shows that the diffusion is not through the whole film. The M-H loop slope decreased from 14.9 to 2.53 and the coercivity increased drastically from about 3100 to 6000Oe when a 4nm Cu capping layer was deposited, which indicates that the exchange coupling between the FePt grains was reduced. The magnetic anisotropy (Ku) firstly decreases from 1.54x107 to 1.12x107erg/cm3 after the deposition 2nm Cu top layer and remains almost constant with 4nm Cu top layer. But the long time annealing will cause the significant decrease of the Ku due to the bulk lattice diffusion. The magnetic reversal process without Cu top layer is dominated by domain wall motion and tends to be rotation mode related to nucleation with the increase of the Cu top layer
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2004.06.050;
- PII
- S0304-8853(04)00727-9;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 284
- Journal Issue
- 3
- Journal Page Range
- p. 423-429
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36070479
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; ANNEALING; COERCIVE FORCE; COUPLING; DEPOSITION; DEPTH; DIFFUSION; FILMS; GRAIN BOUNDARIES; LAYERS; MAGNETIC PROPERTIES; THICKNESS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- DIMENSIONS; ELECTRON SPECTROSCOPY; HEAT TREATMENTS; MICROSTRUCTURE; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.