Published June 15, 2011 | Version v1
Journal article

Oxygen incorporation effects in annealed epitaxial La(1-x)SrxMnO3 thin films

  • 1. Institut Jean Lamour, UMR 7198 CNRS-Nancy Universite, Vandoeuvre-les-Nancy (France)
  • 2. Technical University of Cluj-Napoca, Str. Memorandumului, nr. 28, 400114 Cluj-Napoca (Romania)
  • 3. Science des Procedes Ceramiques et de Traitements de Surface (SPCTS), CNRS UMR 6638, Centre Europeen de la Ceramique, 12 rue Atlantis, 87068 Limoges (France)
  • 4. National Institute for Research and Development of Molecular and Isotopic Technologies, P.O. Box 700, 400293, Cluj-Napoca (Romania)

Description

This paper presents our results regarding oxygen incorporation effects in epitaxial La(1-x)SrxMnO3 thin films, deposited on SrTiO3 (001) single crystal substrates, by annealing in different gas mixtures of argon and oxygen. A particular emphasis is placed on the correlation of structural properties with the magnetic properties of the films, Curie temperature, and coercive field. In this sense, we demonstrate that the evolution of the diffuse part of the ω-scans performed on the films are due to oxygen excess in the film lattice, which creates cationic vacancies within the films. Also, we show that two regimes of oxygen incorporation in the films exist, one in which the films evolve toward a single phase and oxygen stoichiometry is recovered, and a second one dominated by oxygen over-doping effects. In order to support our study, XPS measurements were performed, from which we have evaluated the Mn3+/Mn4+ ionic ratio.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
109
Journal Issue
12
Journal Page Range
p. 123913-123913.5
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2011 American Institute of Physics