Insertion Devices for SESAME
Creators
- 1. SESAME, c/o UNESCO Amman Office, P.O. Box 2270, Amman 11181 (Jordan)
Description
The Phase-I SESAME beamlines have been defined by the scientific research programme of the SESAME users and Insertion Devices (IDs) will be the primary photon sources. It foresees two planar wigglers dedicated for WAFS/XRF and powder diffraction beamlines covering spectral range of 3-30 keV and 3-25 keV respectively, one elliptically polarizing undulator dedicated for Photo-absorption spectroscopy that covers a spectral range of 0.1-1 keV, one undulator dedicated for material science that covers 8-12 keV, one In-vacuum undulator dedicated for MAD protein crystallography covering 5-15 keV and two IR ports from a bending magnet dedicated for IR Spectromicroscopy covering 0.01-1eV. This paper describes the proposed designs for the first two devices and their effects on the SESAME lattice. (author)
Availability note (English)
Available from SESAME: http://old.sesame.org.jo/sesame/images/sesame-publications/Others/APAC20072.pdfAdditional details
Publishing Information
- Imprint Pagination
- 3 p.
Conference
- Title
- Asian Particle Accelerator Conference
- Acronym
- APAC 2007
- Dates
- 29 Jan - 2 Feb 2007
- Place
- Indore (India)
INIS
- Country of Publication
- Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME)
- Country of Input or Organization
- Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME)
- INIS RN
- 50041101
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; BEAM BENDING MAGNETS; COVERINGS; CRYSTALLOGRAPHY; DESIGN; DIFFRACTION; HARBORS; KEV RANGE; PHOTONS; POWDERS; PROTEINS; WIGGLER MAGNETS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BOSONS; CHEMICAL ANALYSIS; COHERENT SCATTERING; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; MAGNETS; MASSLESS PARTICLES; NONDESTRUCTIVE ANALYSIS; ORGANIC COMPOUNDS; SCATTERING; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 7 refs., 9 figs., 3 tabs.