Published 2007 | Version v1
Miscellaneous

Insertion Devices for SESAME

  • 1. SESAME, c/o UNESCO Amman Office, P.O. Box 2270, Amman 11181 (Jordan)

Description

The Phase-I SESAME beamlines have been defined by the scientific research programme of the SESAME users and Insertion Devices (IDs) will be the primary photon sources. It foresees two planar wigglers dedicated for WAFS/XRF and powder diffraction beamlines covering spectral range of 3-30 keV and 3-25 keV respectively, one elliptically polarizing undulator dedicated for Photo-absorption spectroscopy that covers a spectral range of 0.1-1 keV, one undulator dedicated for material science that covers 8-12 keV, one In-vacuum undulator dedicated for MAD protein crystallography covering 5-15 keV and two IR ports from a bending magnet dedicated for IR Spectromicroscopy covering 0.01-1eV. This paper describes the proposed designs for the first two devices and their effects on the SESAME lattice. (author)

Availability note (English)

Available from SESAME: http://old.sesame.org.jo/sesame/images/sesame-publications/Others/APAC20072.pdf

Additional details

Publishing Information

Imprint Pagination
3 p.

Conference

Title
Asian Particle Accelerator Conference
Acronym
APAC 2007
Dates
29 Jan - 2 Feb 2007
Place
Indore (India)

INIS

Country of Publication
Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME)
Country of Input or Organization
Synchrotron-light for Experimental Science and Applications in the Middle East (SESAME)
INIS RN
50041101
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ABSORPTION SPECTROSCOPY; BEAM BENDING MAGNETS; COVERINGS; CRYSTALLOGRAPHY; DESIGN; DIFFRACTION; HARBORS; KEV RANGE; PHOTONS; POWDERS; PROTEINS; WIGGLER MAGNETS; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
BOSONS; CHEMICAL ANALYSIS; COHERENT SCATTERING; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; MAGNETS; MASSLESS PARTICLES; NONDESTRUCTIVE ANALYSIS; ORGANIC COMPOUNDS; SCATTERING; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information

Notes
7 refs., 9 figs., 3 tabs.