Femtosecond laser-induced circular dichroism in silica: Dependence on energy and focusing depth
- 1. ICMMO/SP2M, CNRS-UPSud, Université Paris Sud in Université Paris Saclay, Bâtiment 410, 91405 Orsay Cedex (France)
Description
The paper addresses the creation of strong circular dichroism from a femtosecond laser light with a linear polarization strongly focused in silica glass and perpendicular incidence. All aspects of the experiment are therefore achiral and should not give rise to chiral property creation if taken themselves alone. We investigate the laser-induced circular dichroism according to orientation of the laser polarization, pulse energy and focusing depth. It appears that deep focusing under high numerical aperture conditions leads to higher ellipticity when compared to shallow focusing or low numerical aperture focusing. Strong circular dichroism can be imprinted when polarization is at ±45° of the horizontal scanning direction in reference to the laser plan. In addition the generation of circular dichroism appears to be closely related to the spatial aberration, spatial chirp and beam elongation under strong focusing conditions.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2017.11.011Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2017.11.011;
- PII
- S0168583X17309680;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 435
- Journal Page Range
- p. 258-262
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 19. International Conference on Radiation Effects in Insulators
- Acronym
- REI-19
- Dates
- 2-7 Jul 2017
- Place
- Versailles (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52122947
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- APERTURES; BEAMS; COMPARATIVE EVALUATIONS; DICHROISM; ELONGATION; FOCUSING; GLASS; LASERS; OPTICS; ORIENTATION; POLARIZATION; PROCESSING; PULSES; RACEMATES; SILICA; VISIBLE RADIATION
- Descriptors DEC
- DEFORMATION; ELECTROMAGNETIC RADIATION; EVALUATION; MINERALS; OPENINGS; OXIDE MINERALS; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier B.V. All rights reserved.