Published November 2018 | Version v1
Journal article

Femtosecond laser-induced circular dichroism in silica: Dependence on energy and focusing depth

  • 1. ICMMO/SP2M, CNRS-UPSud, Université Paris Sud in Université Paris Saclay, Bâtiment 410, 91405 Orsay Cedex (France)

Description

The paper addresses the creation of strong circular dichroism from a femtosecond laser light with a linear polarization strongly focused in silica glass and perpendicular incidence. All aspects of the experiment are therefore achiral and should not give rise to chiral property creation if taken themselves alone. We investigate the laser-induced circular dichroism according to orientation of the laser polarization, pulse energy and focusing depth. It appears that deep focusing under high numerical aperture conditions leads to higher ellipticity when compared to shallow focusing or low numerical aperture focusing. Strong circular dichroism can be imprinted when polarization is at ±45° of the horizontal scanning direction in reference to the laser plan. In addition the generation of circular dichroism appears to be closely related to the spatial aberration, spatial chirp and beam elongation under strong focusing conditions.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2017.11.011

Additional details

Identifiers

DOI
10.1016/j.nimb.2017.11.011;
PII
S0168583X17309680;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
435
Journal Page Range
p. 258-262
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
19. International Conference on Radiation Effects in Insulators
Acronym
REI-19
Dates
2-7 Jul 2017
Place
Versailles (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52122947
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APERTURES; BEAMS; COMPARATIVE EVALUATIONS; DICHROISM; ELONGATION; FOCUSING; GLASS; LASERS; OPTICS; ORIENTATION; POLARIZATION; PROCESSING; PULSES; RACEMATES; SILICA; VISIBLE RADIATION
Descriptors DEC
DEFORMATION; ELECTROMAGNETIC RADIATION; EVALUATION; MINERALS; OPENINGS; OXIDE MINERALS; RADIATIONS

Optional Information

Copyright
Copyright (c) 2017 Elsevier B.V. All rights reserved.