On the registration of low energy (E approximately 1 keV/amu) ion tracks in dielectric minerals
- 1. Paris-7 Univ., 75 (France)
- 2. Paris-11 Univ., 91 - Orsay (France). Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse
Description
This paper deals with the interaction of low energy (approximately 1 keV/amu), heavy (Z > 10) ions with solid state track detectors. Such ions, losing their energy mainly by nuclear collisions, trigger the formation of very short latent tracks of damaged material showing an enhanced chemical reactivity. Indeed, shallow etch pits have been successfully revealed in muscovite mica etched in 40% hydrofluoric acid. We investigated in detail the variations of these etch pit characteristics with various parameters (atomic number Z and energy E of the incident ions, thermal annealing temperature T). We had in view to extrapolate to such low energies the track model developed by Dartyge et al. at energies >= 1 MeV/amu. Our main results concern (i) the etching of the tracks as a function of Z and E, (ii) the fine structure of the etch pits as a function of Z and (iii) the annealing properties of the tracks. (author)
Additional details
Publishing Information
- Journal Title
- Radiat. Eff.
- Journal Volume
- 65
- Journal Issue
- 1-4
- Series
- Radiat. Eff.
- Journal Page Range
- 133-137
- ISSN
- 0033-7579
Conference
- Title
- 1. international conference on radiation effects in insulators.
- Dates
- 1981.
- Place
- Arco, Lago di Garda (Italy).
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 14727523
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ATOMIC NUMBER; DIELECTRIC MATERIALS; DIELECTRIC TRACK DETECTORS; ENERGY DEPENDENCE; ETCHING; HEAVY IONS; ION BEAMS; MATHEMATICAL MODELS; MUSCOVITE; PARTICLE TRACKS; PHYSICAL RADIATION EFFECTS; TEMPERATURE DEPENDENCE
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; HEAT TREATMENTS; IONS; MATERIALS; MEASURING INSTRUMENTS; MICA; MINERALS; RADIATION DETECTORS; RADIATION EFFECTS; SURFACE FINISHING