Time-of-flight secondary ion mass spectrometry of polymer surfaces

The effects of polymer variables (molecular weight, polydispersity, and tacticity) and sample preparation parameters (film thickness and casting solvent) on ToF SIMS spectra were studied using a series of polymethyl methacrylate (PMMA) and polybutyl methacrylate (PBMA) standards. The polymers were extensively characterized by a variety of spectroscopic and chromatographic techniques. Films were prepared by solution casting and spin casting methods onto aluminium substrates, which were evaluated by x-ray photoelectron spectroscopy (XPS). These films were characterized by high- and unit-mass resolution ToF SIMS. To determine the level of spectral repeatability standard errors were calculated using three methods of data analysis (absolute intensity (counts), normalised peak intensities (NPIs), and ion intensity ratios). Molecular weight and film thickness had the greatest influence on the SIMS spectra of PMMA, with the differences being most marked at low molecular weight. This was observed in both total negative ion counts and negative ion intensity ratios. An explanation based on the surface concentration of polymer end groups is presented. From these results an extension to the existing mechanisms of ion formation is postulated, which includes end group cleavage. An ion beam damage study of PMMA showed that molecular weight and film thickness affect negative ion spectra. Extended 'surface lifetime' was seen in thin (spun cast) films when compared to thick (solution cast) films. This effect, which was only observed with 'Low' PMMA, was explained in terms of surface chain mobility. The effect of molecular weight was dramatic and an explanation in terms of different origins of diagnostic ions is presented. Molecular weight affected the SIMS spectra of PBMA. However, it was not possible to draw definitive conclusions, because the end groups in three of the samples were not known. (author)