Published December 2008
| Version v1
Journal article
Valence band electronic structure of C60F18 and C60F36 studied by photoelectron spectroscopy
Creators
- 1. Ioffe Physical-Technical Institute RAS, St.-Petersburg 194021 (Russian Federation)
- 2. Chemistry Department, Colorado State University, Fort Collins 80523 (United States)
- 3. Chemistry Department, Moscow State University, Moscow 119899 (Russian Federation)
- 4. Institute of Physics, St. Petersburg State University, St. Petersburg 198904 (Russian Federation)
- 5. Institut fuer Festkoerperphysik, Technische Universitaet Dresden, D-01062 Dresden (Germany)
Description
Photoemission spectra of solid fluorinated fullerenes C60Fx (x = 18, 36) were measured in comparison with parent C60 using synchrotron radiation (hν = 120 eV) providing the spectra in the density of states mode. Creation of the ion-like bonding of fluorine and disappearance of the π-states were observed to be a result of fluorination. Disappearance of the upper lying π-states was revealed to be a reason of the band gap widening upon fluorination
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2008.08.004Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2008.08.004;
- PII
- S0368-2048(08)00097-2;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 168
- Journal Issue
- 1-3
- Journal Page Range
- p. 25-28
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40047061
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL BONDS; ELECTRONIC STRUCTURE; FLUORINATION; FLUORINE; FULLERENES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SYNCHROTRON RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; CARBON; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; HALOGENATION; HALOGENS; NONMETALS; RADIATIONS; SECONDARY EMISSION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.