Published 2016
| Version v1
Journal article
Quality control of the module control for the phase I upgrade of the CMS pixel detector
Creators
- 1. Institut fuer Experimentelle Kernphysik (EKP), KIT (Germany)
- 2. Institut fuer Prozessdatenverarbeitung und Elektronik (IPE), KIT (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Qualitaetskontrolle der Modulproduktion fuer das Phase I Upgrade des CMS-Pixeldetektors
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Hamburg 2016 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 51(2)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG-Fruehjahrstagung 2016 (Spring meeting) of the section matter and cosmos (SMuK) together with the divisions gravity and relativity, radiation and medical physics, particle physics, theoretical and mathematical physics, and the working group philosophy of physics
- Original Conference Title
- DPG-Fruehjahrstagung 2016 der Sektion Materie und Kosmos (SMuK) gemeinsam mit den Fachverbaenden Gravitation und Relativitaetstheorie, Strahlen- und Medizinphysik, Teilchenphysik, Theoretische und Mathematische Grundlagen der Physik sowie der Arbeitsgruppe Philosophie der Physik
- Dates
- 29 Feb - 4 Mar 2016
- Place
- Hamburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 48010207
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BACKGROUND NOISE; CERN LHC; ELECTRIC CONDUCTIVITY; INTEGRATED CIRCUITS; JOINTS; MODULAR STRUCTURES; PARTICLE PRODUCTION; POSITION SENSITIVE DETECTORS; QUALITY CONTROL; READOUT SYSTEMS; RESPONSE FUNCTIONS; SI SEMICONDUCTOR DETECTORS; X-RAY DETECTION
- Descriptors DEC
- ACCELERATORS; CONTROL; CYCLIC ACCELERATORS; DETECTION; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; FUNCTIONS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; NOISE; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Notes
- Session: T 30.5 Mo 17:45