Simplified drift characterization in scanning probe microscopes using a simple two-point method

A very simple and rapid method of drift evaluation, by monitoring two points in the field of view, is proposed. This method can be used by all analysts and requires no special sample or software programming. Data are shown for a modern commercial atomic force microscope (AFM) with closed loop scanners in which significant image distortion arises from drift. The method is fast and simple to implement and allows the drift in the z axis, the image pseudo-magnification and the image pseudo-rotation to be characterized as well as the drifts in the x and y axes available with other methods. The method is compared with the manufacturer's image correlation method for the x and y axes. The demonstrated best precision of the drift observed by both methods is the pixel interval and so the scan area and number of pixels in the scan need to be chosen with this in mind