Published April 1, 1988
| Version v1
Journal article
A closed loop feedback system for synchrotron radiation double crystal monochromators
Creators
- 1. West Virginia Univ., Morgantown (USA). Dept. of Physics
- 2. Brooklyn Coll., NY (USA). Dept. of Physics
Description
We report on a dc closed loop feedback system for a fixed exit double crystal monochromator. The feedback control is part of a complete system which includes beam position and current monitors. The monochromator consists of two identical crystals mechanically coupled so that the two diffraction planes are almost parallel to each other. The feedback system controls a piezoelectric transducer to maintain the new parallelism, and it can be set under computer control to be at any point in the rocking curve at all times. The system has been thoroughly tested and found to be adequate for EXAFS measurements performed on beamline X18B at the National Synchrotron Light Source at Brookhaven National Laboratory. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res., Sect. A
- Journal Volume
- 266
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 471-474
- ISSN
- 0168-9002
- CODEN
- NIMAE
Conference
- Title
- 5. national conference on synchrotron radiation instrumentation (SRI-5).
- Dates
- 21-25 Jun 1987.
- Place
- Madison, WI (USA).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19072957
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM CURRENTS; BEAM MONITORS; BEAM POSITION; BEAM TRANSPORT; BRAGG REFLECTION; CLOSED-LOOP CONTROL; COUPLING; ELECTRONIC GUIDANCE; ENERGY SPECTRA; FEEDBACK; FLUORESCENCE; KEV RANGE 01-10; MONOCHROMATORS; NSLS; PHOTON BEAMS; REMOTE CONTROL; SULFUR; TRANSDUCERS; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; COHERENT SCATTERING; CONTROL; CONTROL SYSTEMS; CURRENTS; DIFFRACTION; ELEMENTS; EMISSION; ENERGY RANGE; KEV RANGE; LUMINESCENCE; MEASURING INSTRUMENTS; MONITORS; NONDESTRUCTIVE ANALYSIS; NONMETALS; PHOTON EMISSION; RADIATION SOURCES; REFLECTION; SCATTERING; SPECTRA; SYNCHROTRON RADIATION SOURCES; X-RAY EMISSION ANALYSIS