Published 2008 | Version v1
Journal article

Effects of the high-energy proton irradiation on the properties of GaN ionizing radiation detectors

  • 1. Semiconductor Physics Department and Institute of Materials Science and Applied Research, Vilnius University (Lithuania)
  • 2. Institute of Physics, Vilnius (Lithuania)

Description

Effects of the irradiation by 24 GeV protons on the properties of GaN ionizing radiation detectors were investigated. Irradiation dozes ranged from 1 x 1014 up to 1 x 1016 p/cm2. In the γ-spectra of the samples radiation of 7Be, 22Na and other long-living radionuclides with A<70 was identified. Their activities were proportional to the total irradiation doses. Device contact properties were analysed by IV dependencies. Created defects were revealed by the thermally stimulated spectroscopy. In the less irradiated samples the following values of the effective thermal activation energies were found: 0.12-0.16 eV, 0.18-0.22 eV, 0.35-0.42 eV and 0.84-0.94 eV. Meanwhile in the detectors irradiated with the highest dozes only current growth with the activation energy of about 0.8-1.0 eV could be identified. Effects of percolation transport in disordered media were proved in the irradiated material. (copyright 2008 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssc.200779158

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. C, Conferences
Journal Volume
5
Journal Issue
9
Journal Page Range
p. 3029-3031
ISSN
1610-1634

Conference

Title
34. International symposium on compound semiconductors (ISCS-2007)
Dates
15-18 Oct 2007
Place
Kyoto (Japan)

Optional Information

Notes
With 6 figs., 6 refs.. SICI: 1610-1634(200807)5:9<3029::AID-PSSC200779158>3.0.TX;2-G