Published June 2013 | Version v1
Journal article

High acceptance high resolution soft X-ray grating spectrometer: Choice of optical design

  • 1. Synchrotron SOLEIL, L'Orme des Merisiers, Saint Aubin, BP 48, 91192 Gif-sur-Yvette Cedex (France)
  • 2. UPMC Univ. Paris 06, CNRS UMR 7614, Laboratoire de Chimie Physique – Matière et Rayonnement, 75321 Paris Cedex 05 (France)

Description

Highlights: ► Optical design to maximize angular acceptance of soft X-ray grating spectrometer. ► Comparison between spherical and elliptical focusing mirror using numerical analysis of light path function. ► Resolving power taking into account mirrors aberrations and slope errors. -- Abstract: Elementary excitations in correlated electron systems produce low intensity spectral features that may be observed by resonant inelastic X-ray scattering (RIXS). In the soft X-ray region, ruled gratings are used to obtain optimum energy dispersion. Gratings have to operate at small grazing incidence so that in practice the angular acceptance is small. Schemes have been proposed using varied line spacing plane gratings combined with large focusing mirrors to increase acceptance. Here we analyze the relative performance of spherical and elliptical mirrors by means of numerical calculations of the light path function. We show that the use of an elliptical mirror provides higher resolving power over an extended energy range. Thus the 50–1000 eV energy range can be covered by two gratings only and the resolving power can be adapted to the experimental conditions

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2012.11.006

Additional details

Identifiers

DOI
10.1016/j.elspec.2012.11.006;
PII
S0368-2048(12)00144-2;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
188
Journal Page Range
p. 121-126
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.