Electrons for single molecule diffraction and imaging
Creators
- 1. Key Laboratory for Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871 (China)
- 2. Department of Material Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801 (United States)
- 3. College of Chemistry and Molecular Engineering, Peking University, Beijing 100871 (China)
Description
We demonstrate the potential of electrons for single molecule diffraction and imaging using C60 molecules confined inside single-walled carbon nanotubes (C60s@SWCNT or peapod) as a model system. A 25 nm diameter electron beam from a field emission gun source is used to record diffraction patterns from individual peapods using imaging plates. The electron beam illuminates about 25 C60 molecules. Experimentally, we found that the molecules diffract inside ∼15% of the host nanotubes. With the help of simulations, we explore the limits of electron molecular diffraction and its sensitivity to the molecular configurations. We show that the combination of electron diffraction and electron direct imaging provides the best approach to single molecule imaging. -- Highlights: ► Electron diffraction of C60 molecules inside a single-walled carbon nanotube is demonstrated. ► Electron diffraction sensitivity is discussed and compared with imaging sensitivity. ► A combination of diffraction and imaging is proposed for single molecule imaging.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2011.11.007Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2011.11.007;
- PII
- S0304-3991(11)00274-9;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 119
- Journal Page Range
- p. 72-77
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45028000
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CARBON NANOTUBES; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONS; FIELD EMISSION; FULLERENES; MOLECULAR STRUCTURE; MOLECULES; PLATES; SENSITIVITY
- Descriptors DEC
- BEAMS; CARBON; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; EVALUATION; FERMIONS; LEPTON BEAMS; LEPTONS; NANOSTRUCTURES; NANOTUBES; NONMETALS; PARTICLE BEAMS; SCATTERING; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.