Published 1996
| Version v1
Book
In-situ surface monitoring system for synchrotron mirrors under high heat load
Creators
- 1. Argonne National Lab., IL (United States). Advanced Photon Source
Description
A portable electro-optical system capable of real-time measurements of surface distortions down to 0.5 microrad is described, limited primarily by the short-term system stability. Methods to reduce the system fluctuations and to enhance the detectable resolution are explained. Although designed for use with mirrors for synchrotron radiation sources, this system has the flexibility to be applied to other optical components. The prototype system has been tested on a sample mirror piece, and preliminary results are presented. A brief discussion about the extension of this metrology unit to adaptive optics is also given
Additional details
Publishing Information
- Publisher
- Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-2244-4
- Imprint Title
- Optics for high-brightness synchrotron radiation beamlines II
- Imprint Pagination
- 368 p.
- Series
- Proceedings/SPIE, Volume 2856.
- Journal Page Range
- p. 183-196.
Conference
- Title
- 1. conference on space processing of materials, at SPIE International Society for Optical Engineering (SPIE) annual international symposium on optical science, engineering, and instrumentation.
- Acronym
- Denver '96
- Dates
- 4-9 Aug 1996.
- Place
- Denver, CO (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28075404
- Subject category
- S43: PARTICLE ACCELERATORS; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATOR FACILITIES; DIAGNOSTIC TECHNIQUES; MEASURING METHODS; MIRRORS; MONITORING; OPTICAL SYSTEMS; REAL TIME SYSTEMS; SYNCHROTRON RADIATION SOURCES
- Descriptors DEC
- RADIATION SOURCES
Optional Information
- Contract/Grant/Project number
- Contract W-31109-ENG-38
- Funding organization
- USDOE, Washington, DC (United States).
- Secondary number(s)
- CONF-960848--.