An Image Analysis System (IAS) for parametric studies of nuclear tracks
Creators
- 1. Radiation Safety Systems Div., Bhabha Atomic Research Centre, Mumbai (India)
- 2. Electronics Systems Div., Bhabha Atomic Research Centre, Mumbai (India)
Description
A computer based Image Analysis System (IAS) was set up at BARC for automation in nuclear track counting and measurement of track parameters such as diameter, roundness, object brightness, etc. The end use includes identification of charge particles and energy discrimination. The IAS was satisfactorily used for participation in an international intercomparison exercise'97 conducted by Atomic Energy Research Institute, Hungary. The analysis involved a total of 10,000 frames containing nearly 6000 alpha/proton tracks. The system permits improvements in image quality through background correction and contour smoothing. The paper briefly describes the IAS, discusses optimisation of various system parameters such as brightness thresholding and suggests further improvements to maximise the speed of analysis. The results of intercomparison are presented in another paper in the symposium. (author)
Additional details
Publishing Information
- Publisher
- Guru Nanak Dev University
- Imprint Place
- Amritsar (India)
- Imprint Title
- Solid state nuclear track detectors and applications
- Imprint Pagination
- 356 p.
- Journal Page Range
- p. 125-131
Conference
- Title
- 11. national symposium on solid state nuclear track detectors and applications
- Acronym
- SSNTD-98
- Dates
- 12-14 Oct 1998
- Place
- Amritsar (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 31041847
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA PARTICLES; AUTOMATION; CALIBRATION; DATA ANALYSIS; DATA PROCESSING; DIELECTRIC TRACK DETECTORS; IMAGE PROCESSING; PARAMETRIC ANALYSIS; PARTICLE TRACKS; PERFORMANCE; SPECIFICATIONS
- Descriptors DEC
- CHARGED PARTICLES; IONIZING RADIATIONS; MEASURING INSTRUMENTS; PROCESSING; RADIATION DETECTORS; RADIATIONS
Optional Information
- Notes
- 3 refs., 4 figs.