Published February 2005
| Version v1
Journal article
Interlayer exchange coupling in Co/Ru/Co trilayers
Creators
- 1. INFM, Unita di Perugia, Via A. Pascoli, 06123 Perugia (Italy)
- 2. INFM-Dipartimento di Fisica dell'Universita, Via Pascoli, 06123 Perugia (Italy)
- 3. INFM-Dipartimento di Fisica dell'Universita, Via Paradiso 12, 44100 Ferrara (Italy)
- 4. MINT Center, University of Alabama, Tuscaloosa, AL 35487 (United States)
Description
The dependence of the interlayer exchange coupling in Si(0 0 1)/Ta/Co/Ru/Co/Ta trilayer on the thickness of the top Co layer is investigated. A strong in-plane uniaxial anisotropy is created in the magnetic layers by the shape anisotropy of an obliquely sputtered Ta underlayer, as confirmed by magnetometry and Brillouin light scattering measurements. The evolution of the magnetic properties, such as the magnetization at remanence and the saturation fields of the hysteresis loops and the giant magnetoresistance, is discussed in terms of the bilinear and biquadratic exchange coupling coefficients
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2004.09.100;
- PII
- S0304-8853(04)01028-5;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 286
- Journal Issue
- 1-3
- Journal Page Range
- p. 468-472
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36074762
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; COBALT; COUPLING; HYSTERESIS; LAYERS; LIGHT SCATTERING; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETORESISTANCE; RUTHENIUM; SILICON; TANTALUM; THICKNESS
- Descriptors DEC
- DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; METALS; PHYSICAL PROPERTIES; PLATINUM METALS; REFRACTORY METALS; SCATTERING; SEMIMETALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.