Published November 2018 | Version v1
Journal article

The first principle study of the electronic structure of SixGe(1−x) alloy films

  • 1. College of Science, Kaili University, Kaili 556011 (China)
  • 2. School of Physics, Nanjing University, Nanjing 210023 (China)
  • 3. School of Physics, Guizhou University, Guiyang 550025 (China)

Description

Highlights: • The band gap of SiGe alloy film is related to the thickness of the film and the content of silicon. • Band gap maps are given in different films thicknesses and Si content. • The change maps of direct band gap and indirect band gap of SiGe alloy films are given. - Abstract: First principles calculation based on density functional theory (DFT) with the generalized gradient approximation (GGA) are carried out to investigate the electronic band structures of SixGe(1x) alloys nanofilms. The calculation results show that the band gaps of (100), (110) and (111) surfaces SixGe(1x) alloy films with different thickness first increase with the increase of Si content, then flatten out, and finally decrease. At the same time, the transformation of direct band gap and indirect band gap occurs when the thickness of films and Si content of the three surface SixGe(1x) alloy films changes to a certain critical condition. It will be a good way to obtain direct-gap band emission in SixGe(1x) alloys materials.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2018.09.035

Additional details

Identifiers

DOI
10.1016/j.physleta.2018.09.035;
PII
S0375960118309952;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
382
Journal Issue
47
Journal Page Range
p. 3418-3422
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51015141
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ALLOYS; APPROXIMATIONS; DENSITY FUNCTIONAL METHOD; ELECTRONIC STRUCTURE; GERMANIUM SILICIDES; MAPS; NANOFILMS; SURFACES; THICKNESS
Descriptors DEC
CALCULATION METHODS; DIMENSIONS; FILMS; GERMANIUM COMPOUNDS; MATERIALS; NANOMATERIALS; SILICIDES; SILICON COMPOUNDS; THIN FILMS; VARIATIONAL METHODS

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.