Published November 11, 2010 | Version v1
Journal article

Soft X-ray measurements in magnetic fusion plasma physics

  • 1. Associazione Euratom-ENEA sulla Fusione, 00044 Frascati (Italy)
  • 2. Association EURATOM-CEA, CEA Cadarache, DSM/IRFM 13108 St Paul Lez Durance Cedex (France)

Description

Soft X-ray diagnostic systems and their successful application in the field of magnetic fusion plasma physics are discussed. Radiation with wavelength in the region of Soft X-Ray (1-30 keV) is largely produced by high temperature plasmas, carrying important information on many processes during a plasma discharge. Soft X-ray diagnostics are largely used in various fusion devices all over the world. These diagnostic systems are able to obtain information on electron temperature, electron density, impurity transport, Magneto Hydro Dynamic instabilities. We will discuss the SXR diagnostic installed on FTU in Frascati (Italy) and on Tore Supra in Cadarache (France), with special emphasis on diagnostic performances. Moreover, we will discuss the two different inversion methods for tomographic reconstruction used in Frascati and in Cadarache, the first one is relied on a guessed topology of iso-emissivity surfaces, the second one on regularization techniques, like minimum Fisher or maximum entropy. Finally, a new and very fast 2D imaging system with energy discrimination and high time resolution will be summarized as an alternative approach of SXR detection system.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.02.097

Additional details

Identifiers

DOI
10.1016/j.nima.2010.02.097;
PII
S0168-9002(10)00333-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
623
Journal Issue
2
Journal Page Range
p. 747-749
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
1. international conference on frontiers in diagnostics technologies
Dates
25-27 Nov 2009
Place
Frascati (Italy)

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.