Published August 1, 2005 | Version v1
Journal article

Determination of damping force between atomic force microscope tips and sample using an inverse methodology

  • 1. Department of Mechanical Engineering, Kun Shan University of Technology, Tainan 71003, Taiwan (China)
  • 2. Department of Mechanical Engineering, Wu Feng Institute of Technology, Chia-I 621, Taiwan (China)
  • 3. Department of Information Management, Kun Shan University of Technology, Tainan 71003, Taiwan (China)

Description

In this Letter, the determination of the damping force between the atomic force microscope (AFM) tips and sample is regarded as an inverse vibration problem. The inverse solution methodology based on the conjugate gradient method is presented for estimating the interaction force and the damping force. The method is required to treat the inverse problem using available displacement measurements of AFM cantilever. Numerical results show that the method can accurately estimate the interaction force and the damping force even for problems with error of displacement measurement. In addition, the initial guesses for the interaction force can be arbitrarily chosen and the computing time required for the inverse calculations takes less than one second using a Pentium III-450 MHz PC

Additional details

Identifiers

DOI
10.1016/j.physleta.2005.06.005;
PII
S0375-9601(05)00834-0;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
343
Journal Issue
1-3
Journal Page Range
p. 79-84
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37036913
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DAMPING; ERRORS; INTERACTIONS; MATHEMATICAL SOLUTIONS
Descriptors DEC
MICROSCOPY

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.