Determination of damping force between atomic force microscope tips and sample using an inverse methodology
- 1. Department of Mechanical Engineering, Kun Shan University of Technology, Tainan 71003, Taiwan (China)
- 2. Department of Mechanical Engineering, Wu Feng Institute of Technology, Chia-I 621, Taiwan (China)
- 3. Department of Information Management, Kun Shan University of Technology, Tainan 71003, Taiwan (China)
Description
In this Letter, the determination of the damping force between the atomic force microscope (AFM) tips and sample is regarded as an inverse vibration problem. The inverse solution methodology based on the conjugate gradient method is presented for estimating the interaction force and the damping force. The method is required to treat the inverse problem using available displacement measurements of AFM cantilever. Numerical results show that the method can accurately estimate the interaction force and the damping force even for problems with error of displacement measurement. In addition, the initial guesses for the interaction force can be arbitrarily chosen and the computing time required for the inverse calculations takes less than one second using a Pentium III-450 MHz PC
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2005.06.005;
- PII
- S0375-9601(05)00834-0;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 343
- Journal Issue
- 1-3
- Journal Page Range
- p. 79-84
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37036913
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DAMPING; ERRORS; INTERACTIONS; MATHEMATICAL SOLUTIONS
- Descriptors DEC
- MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.