Published 1997
| Version v1
Miscellaneous
X-ray grazing incidence diffraction from multilayers
- 1. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
Description
Grazing incidence scattering geometries using synchrotron radiation have been applied in order to characterise the roughness profiles and the structural coherence of multilayers. The lateral correlation length of the roughness profiles was evaluated using diffuse reflectivity in the 'out of plane' geometry. This type of measurement is the only diffuse reflectivity technique allowing large lateral momentum transfer. It is typically suitable for correlation lengths smaller than 1000 A. The lateral structural coherence length of Ni3Al/Ni multilayers as a function of the layer thickness was obtained by grazing incidence diffraction (GID). 3 figs., 1 ref
Additional details
Publishing Information
- Publisher
- Paul Scherrer Institut.
- Imprint Place
- Villigen PSI (Switzerland)
- Imprint Title
- Paul Scherrer Institut annual report 1996. Annex IIIA: solid state research at large facilities
- Imprint Pagination
- 180 p.
- Journal Page Range
- p. 100.
- Report number
- INIS-CH--004
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 28058194
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM ALLOYS; DIFFRACTION; EXPERIMENTAL DATA; GRAZING INCIDENCE TOMOGRAPHY; LAYERS; NICKEL ALLOYS; REFLECTIVITY; ROUGHNESS; SYNCHROTRON RADIATION; X RADIATION
- Descriptors DEC
- ALLOYS; BREMSSTRAHLUNG; COHERENT SCATTERING; DATA; ELECTROMAGNETIC RADIATION; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SURFACE PROPERTIES; TOMOGRAPHY; TRANSITION ELEMENT ALLOYS